Micro-discharge sensitive curve drawing method

The invention discloses a micro-discharge sensitive curve drawing method, which comprises the following steps of: quickly positioning a peripheral micro-discharge threshold at a determined micro-discharge threshold point by quantifying the change trend of the number of electrons under a specified vo...

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Bibliographische Detailangaben
Hauptverfasser: QU HAO, LIN SHU, WANG HONGGUANG, PENG MIN, ZHONG HUAN, LI YONGDONG, ZHAI YONGGUI, CHEN CHENG
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a micro-discharge sensitive curve drawing method, which comprises the following steps of: quickly positioning a peripheral micro-discharge threshold at a determined micro-discharge threshold point by quantifying the change trend of the number of electrons under a specified voltage condition and calculating the boundary continuity of a sensitive area in a parameter area by adopting a grid search method; therefore, rapid drawing of the overall micro-discharge sensitive curve is realized, and the drawing time consumption of the overall sensitive curve is greatly reduced. Compared with other methods, the method is suitable for all simulation methods capable of obtaining electron number change curves and micro-discharge conditions with any complex field distribution, and can provide great convenience for micro-discharge-free microwave device design in space microwave communication engineering. 本发明公开了一种微放电敏感曲线绘制方法,通过量化指定电压条件下电子数目的变化趋势,并利用计算参数区域内敏感区域的边界连续性,采用网格式搜寻法在已确定的微放电阈值点快速定位周边的微放电阈值,进而实现