Full-automatic chip aging test equipment

The invention relates to full-automatic chip aging test equipment, and belongs to the technical field of chip detection. A base is included; the four side plates are hinged to the four side edges of the top of the base correspondingly, and the four side plates are attached to one another to form a square box body when being in a vertical state; the top plate is respectively connected with the tops of the four side plates through connecting parts to form a sealed box body; the plugging plate is movably arranged at the top of the base and is matched with the top surface of the base in size; and the four groups of turnover mechanisms are respectively arranged at the bottoms of the four side plates and are simultaneously matched with the plugging plates. By designing the four turnover side plates, chips in different testing stages can be taken out and put in, testing of other chips cannot be affected in the operation process, the operation flexibility and the testing efficiency are improved, meanwhile, after the