Single board test circuit and method

The invention relates to a single board test circuit and method, the single board test circuit comprises a plurality of to-be-tested devices, the plurality of to-be-tested devices comprise at least one target to-be-tested device, and a voltage conversion circuit is connected between each target to-be-tested device and a bus voltage. And the voltage conversion circuit is used for converting the bus voltage into the test voltage required by the corresponding target device to be tested. Wherein the target to-be-tested device represents a device of which the required test voltage is smaller than the bus voltage of the single board, and the parameters in each voltage conversion circuit are configured according to the test voltage required by the corresponding target to-be-tested device. By adopting the test current and the test method, part of devices can be prevented from being damaged when the single board function test is carried out. 本申请涉及一种单板测试电路和方法，该单板测试电路上包括多个待测器件，多个待测器件中包括至少一个目标待测器件，各目标待测器件与总线电压之间均连接一个电压变换