Waveform calibration method and system, electronic equipment and medium
The invention relates to the technical field of electronics, and discloses a waveform calibration method and system, electronic equipment and a medium. The waveform calibration method comprises the following steps: acquiring first vibration waveform data; determining an ith starting point and an ith...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to the technical field of electronics, and discloses a waveform calibration method and system, electronic equipment and a medium. The waveform calibration method comprises the following steps: acquiring first vibration waveform data; determining an ith starting point and an ith ending point in the first vibration waveform data; determining a scaling coefficient according to a first resonant frequency corresponding to the first vibration waveform data and a current second resonant frequency of the electronic equipment; scaling the vibration waveform data between the i-th starting point and the i-th ending point by using a scaling coefficient to obtain the calibrated i-th section of waveform data; and driving the vibration assembly to vibrate according to the ith-segment waveform data. According to the waveform calibration method, the vibration waveform data can be segmented and processed, and the vibration waveform data can be calibrated in real time.
本申请涉及电子技术领域,公开了一种波形校准方法、系统、电子设备及介质。本申 |
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