MEASUREMENT SYSTEM AND MEASUREMENT METHOD

A measurement system according to one embodiment of the present invention measures the intensity distribution of diffracted X-rays obtained by irradiating X-rays onto a rounded corner portion of a metal structure having a shaft portion and a flange portion projecting from the shaft portion in the ra...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ADACHI HITOMI, YAKURA RYOTA, KABUTOMORI TATSUHIKO, MATSUDA MARIKO
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE PHYSICS TESTING
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