MEASUREMENT SYSTEM AND MEASUREMENT METHOD

A measurement system according to one embodiment of the present invention measures the intensity distribution of diffracted X-rays obtained by irradiating X-rays onto a rounded corner portion of a metal structure having a shaft portion and a flange portion projecting from the shaft portion in the ra...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: ADACHI HITOMI, YAKURA RYOTA, KABUTOMORI TATSUHIKO, MATSUDA MARIKO
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:A measurement system according to one embodiment of the present invention measures the intensity distribution of diffracted X-rays obtained by irradiating X-rays onto a rounded corner portion of a metal structure having a shaft portion and a flange portion projecting from the shaft portion in the radial direction, the rounded corner portion being at a connection portion between the shaft portion and the flange portion, the measurement system is provided with: a diffracted X-ray measurement device having an irradiation unit for irradiating X-rays to the fillet part; and a positioning device for positioning the diffracted X-ray measurement device with respect to the rounded portion, the positioning device comprising: a movement mechanism for moving the diffracted X-ray measurement device three-dimensionally relative to the rounded portion; and a rotation mechanism that rotates the diffracted X-ray measurement device in the direction in which the incident angle of the X-ray with respect to the rounded portion ch