Wear monitoring device

The invention relates to a wear monitoring device. The disclosed technology generally relates to integrated circuit devices with wear monitoring capabilities. In one embodiment, an integrated circuit device includes a wear monitoring device configured to record an indication of wear of a core circui...

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Bibliographische Detailangaben
Hauptverfasser: HEFFERNAN COLM PATRICK, BRADLEY SHAUN, BOLAND DAVID, O 'DWYER THOMAS G, CLARKE DAVID J, MANNING KEVIN B, COYNE EDWARD JOHN, O 'DONNELL ALAN J, FORD MARK, AHERNE DAVID, ROUBY MICKAEL
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention relates to a wear monitoring device. The disclosed technology generally relates to integrated circuit devices with wear monitoring capabilities. In one embodiment, an integrated circuit device includes a wear monitoring device configured to record an indication of wear of a core circuit separate from the wear monitoring device, where the indication is related to local diffusion of a diffusant within the wear monitoring device in response to wear stresses that wear the core circuit. 本公开涉及磨损监控装置。所公开的技术一般涉及具有磨损监控能力的集成电路装置。集成电路装置包括磨损监控装置,配置为记录与磨损监控装置分开的核心电路的磨损指示,其中所述指示与所述磨损监控装置内的扩散剂的局部扩散有关,以响应使所述核心电路磨损的磨损应力。