Phi1200mm maximum aperture plane optical interference testing device

The invention discloses a Phi1200mm large aperture plane optical interference test device, which comprises an integrated control module, a laser light source module, a small port interference test module, a large port interference test module, an imaging module, a switching module and a rapid alignm...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ZHANG ZHIHUA, HUANG DAN, WANG XUEZHU, ZHAO ZIJIA, CHEN HUI, GE RUIHONG, ZHAO ZHILIANG, CHUNYU YONGXIN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS RADIATION PYROMETRY TESTING
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