Bad shunt section statistical analysis method based on TDCS or CTC system
The invention discloses a statistical analysis method for a bad shunt section based on a TDCS or CTC system, and relates to the technical field of railway signal systems, and the method comprises the following steps: S1, obtaining the latest station configuration data of the TDCS or CTC system, and...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a statistical analysis method for a bad shunt section based on a TDCS or CTC system, and relates to the technical field of railway signal systems, and the method comprises the following steps: S1, obtaining the latest station configuration data of the TDCS or CTC system, and making the latest station configuration data into a station data file; s2, acquiring an equipment state file generated in the running process of the TDCS or CTC system; s3, analyzing the equipment state file by using the station data file to obtain all station equipment information; s4, using the station equipment information to obtain a registration and sale record table and an equipment state change table; s5, obtaining a rolling way detail table by using the station equipment information; and S6, counting bad branch sections according to a multi-dimensional mode by using the registration and sale record table, the equipment state change table and the rolling way detail table to obtain existing records, registrat |
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