Measurement method
A method for inspecting at least one feature of a part, the at least one feature having a predetermined nominal shape, the method comprising: i) loading a contact probe onto a probe mount of a coordinate positioning device, a contact probe includes a probe mount configured to facilitate replacement...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | A method for inspecting at least one feature of a part, the at least one feature having a predetermined nominal shape, the method comprising: i) loading a contact probe onto a probe mount of a coordinate positioning device, a contact probe includes a probe mount configured to facilitate replacement of a probe thereon and configured to facilitate relative movement of the probe mount with a part in three orthogonal degrees of freedom, the contact probe including a reference member for engaging the part, and the contact probe further including a stylus configured to engage the part with the reference member. The contact pin can be deflected relative to the reference component and is provided with an end head for contacting a surface to be measured, and the relative position of the end head and the reference component is converted; ii) bringing a reference member of the contact probe and the stylus into contact with the part on one side of the feature, then causing the stylus to traverse the feature, while collec |
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