Method and device for determining layout analysis model, electronic equipment and storage medium
The embodiment of the invention discloses a layout analysis model determination method and device, electronic equipment and a medium. Based on a pre-trained layout analysis model, determining at least one layout pseudo tag of the unmarked layout sample, and obtaining a candidate pseudo tag sample wi...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The embodiment of the invention discloses a layout analysis model determination method and device, electronic equipment and a medium. Based on a pre-trained layout analysis model, determining at least one layout pseudo tag of the unmarked layout sample, and obtaining a candidate pseudo tag sample with the layout pseudo tag; for each type of layout pseudo label, based on an initial feature extraction model of the layout pseudo label, determining a hyper-sphere center corresponding to the layout pseudo label, and determining a target hyper-sphere radius of the layout pseudo label according to the marked layout sample and the hyper-sphere center corresponding to the layout pseudo label; according to the target hypersphere radius of the layout pseudo tag, screening a target pseudo tag sample from candidate pseudo tag samples corresponding to the layout pseudo tag; and training the pre-trained layout analysis model according to the target pseudo label samples of the various layout pseudo labels to obtain a target |
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