Dynamic phase noise testing method and system
The invention discloses a dynamic phase noise test method, which comprises the following steps that a plurality of crystal oscillators are simultaneously fixed on a vibration test bench through a special clamp, under a set vibration condition, in each sampling period, a multiplexer switch is control...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a dynamic phase noise test method, which comprises the following steps that a plurality of crystal oscillators are simultaneously fixed on a vibration test bench through a special clamp, under a set vibration condition, in each sampling period, a multiplexer switch is controlled by a computer to sample output signals of the crystal oscillators in turn, and the output signals of the crystal oscillators are obtained; the number of the sampling periods reaches a set count value; and calculating the phase noise value of any crystal oscillator under the set vibration condition according to the obtained sampling data. The invention also comprises a system for carrying out dynamic phase noise testing by using the method. The problems of low efficiency and large error of single crystal oscillator testing are solved.
本申请公开了一种动态相位噪声测试方法,包括以下步骤:多个晶体振荡器同时通过专用夹具固定在振动试验台上,在设定的振动条件下,在每一个采样周期内,通过电脑控制多路选择开关轮流对各个晶体振荡器输出信号进行采样,直到采样周期的数量达到设定的计数值;根据获得的采样数据,计算任一晶体振荡器在所述设定的振动条件下的相位噪声值。本申请还包含使用所述方法进行动态相位噪声测试的 |
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