Method for observing internal microtopography of spherical silicon dioxide micro powder particles

The invention discloses a method for observing the internal microstructure of spherical silicon dioxide micro-powder particles, which comprises the following steps: putting a proper amount of spherical silicon dioxide micro-powder into molten resin, putting the molten resin into a grinding tool cyli...

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Hauptverfasser: SHU MINDI, ZHAO XIUFANG, ZHANG PENG, ZHANG YUWEN, JIANG LIWEI, FENG DANDAN, HU JING, GAO LIRONG, XU YANYAN, XU FAN, LI JIANDE
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a method for observing the internal microstructure of spherical silicon dioxide micro-powder particles, which comprises the following steps: putting a proper amount of spherical silicon dioxide micro-powder into molten resin, putting the molten resin into a grinding tool cylinder, putting the grinding tool cylinder into a sample pressing machine, pressing the mixture into a columnar shape, taking out a columnar sample, and polishing the columnar sample on a polishing machine by using a polishing abrasive disc, and washing with water during polishing, drying the polished sample in a drying oven, observing the polished surface of the dried sample in a field emission scanning electron microscope, and clearly observing the low-light structure in the spherical silicon dioxide micro-powder particles. 本发明公开了一种观察球形二氧化硅微粉颗粒内部微观形貌的方法,将适量球形二氧化硅微粉放入熔化的树脂里面,放入磨具圆筒中,将磨具圆筒放在压样机里将混合物压制成柱状,将柱状样品取出后在抛光机上用抛光砂片进行抛光,抛光时用水冲洗,抛光好的样品放入烘箱内烘干,将烘干后的样品在场发射扫描电镜内观察其抛光面,可以清晰的观察到球形二氧化硅微粉颗粒内部的微光结构。