Multifunctional test system and method for IO-Link master station
The invention discloses a multifunctional test system and method for an IO-Link master station, belongs to the field of IO-Link master stations, and relates to a multifunctional test technology. Comprising a multifunctional testing device, an IO-Link master station and an upper computer configuratio...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a multifunctional test system and method for an IO-Link master station, belongs to the field of IO-Link master stations, and relates to a multifunctional test technology. Comprising a multifunctional testing device, an IO-Link master station and an upper computer configuration module, the multifunctional testing device is provided with one or more IO-Link interfaces, and the multifunctional testing device is connected with an IO-Link port of the IO-Link master station through the arranged IO-Link interfaces; a single IO-Link port of the IO-Link master station can be simulated to be connected with different types of IO-Link equipment for testing, and a plurality of ports can be tested concurrently, so that the capability of the IO-Link master station in coping with multi-port communication can be reflected more comprehensively and intuitively; the problem that a current IO-Link master station can only test a fixed type of equipment or can only test a single port during testing is solved |
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