Test defect data acquisition method and device, equipment and storage medium
The invention discloses a test defect data acquisition method and device, equipment and a storage medium. The method comprises the following steps: acquiring a test video; analyzing the test video frame by frame, generating operation information according to the analyzed video frame when the style o...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a test defect data acquisition method and device, equipment and a storage medium. The method comprises the following steps: acquiring a test video; analyzing the test video frame by frame, generating operation information according to the analyzed video frame when the style of an operable icon in the analyzed video frame is a set style, and taking the video frame as a starting frame; video frames subsequent to the starting frame continue to be analyzed, when a first video frame different from the starting frame is analyzed, result information is generated according to the analyzed video frame, and the video frame serves as an ending frame corresponding to the starting frame; if the result information contains the abnormal keyword, stopping analyzing the test video, and generating defect data according to the operation information and the result information; and if the result information does not contain the abnormal keyword, circularly executing defect data acquisition operation on the |
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