Transformer testing system
The invention discloses a transformer test system. The system is composed of a sine wave generator, a micro-control unit MCU, a Fourier transform unit and a high-frequency current acquisition module. Wherein the sine wave generator is used for generating a sine wave under the control of the MCU and...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a transformer test system. The system is composed of a sine wave generator, a micro-control unit MCU, a Fourier transform unit and a high-frequency current acquisition module. Wherein the sine wave generator is used for generating a sine wave under the control of the MCU and inputting the sine wave into a transformer to be tested, so that the transformer outputs a secondary voltage waveform signal and a high-frequency discharge current signal; the Fourier transform unit is used for performing Fourier transform on the secondary voltage waveform signal to obtain a frequency domain signal; the high-frequency current acquisition module is used for performing analog amplification and A/D conversion on the high-frequency discharge current signal to obtain a detection signal; the MCU is used for judging whether flashover exists on the secondary side of the transformer or not and analyzing whether the detection signal indicates that partial discharge exists on the transformer or not so as to d |
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