Chip capacitor testing machine

Chip capacitor testing machine

The invention discloses a chip capacitor testing machine. The chip capacitor testing machine comprises a feeding device, a testing device and a discharging device. The feeding device comprises a feeding mechanism and a conveying mechanism, the feeding mechanism is used for storing to-be-tested capac...

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Hauptverfasser: TANG JIEXIANG, LIANG XIUGANG, YU WENLIN
Format: Patent
Sprache:chi ; eng
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MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator TANG JIEXIANG
LIANG XIUGANG
YU WENLIN
description The invention discloses a chip capacitor testing machine. The chip capacitor testing machine comprises a feeding device, a testing device and a discharging device. The feeding device comprises a feeding mechanism and a conveying mechanism, the feeding mechanism is used for storing to-be-tested capacitors, and the conveying mechanism is used for conveying the to-be-tested capacitors of the feeding mechanism; the testing device comprises a turntable mechanism and a testing mechanism, a testing motor drives a plurality of transmission parts to move synchronously to enable a testing needle to clamp a to-be-tested capacitor, and then a lifting plate is lifted through a lifting air cylinder to enable the to-be-tested capacitor to be in a suspended state for testing; the discharging device comprises a material distributing mechanism and a material receiving mechanism, the material distributing mechanism is used for placing the tested capacitors on the testing rotating disc into the material collecting grooves in the
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN115980392A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN115980392A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN115980392A3</originalsourceid><addsrcrecordid>eNrjZJBzzsgsUEhOLEhMzizJL1IoSS0uycxLV8hNTM7IzEvlYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxUBdqXmpJfHOfoaGppYWBsaWRo7GxKgBAPKZJH4</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Chip capacitor testing machine</title><source>esp@cenet</source><creator>TANG JIEXIANG ; LIANG XIUGANG ; YU WENLIN</creator><creatorcontrib>TANG JIEXIANG ; LIANG XIUGANG ; YU WENLIN</creatorcontrib><description>The invention discloses a chip capacitor testing machine. The chip capacitor testing machine comprises a feeding device, a testing device and a discharging device. The feeding device comprises a feeding mechanism and a conveying mechanism, the feeding mechanism is used for storing to-be-tested capacitors, and the conveying mechanism is used for conveying the to-be-tested capacitors of the feeding mechanism; the testing device comprises a turntable mechanism and a testing mechanism, a testing motor drives a plurality of transmission parts to move synchronously to enable a testing needle to clamp a to-be-tested capacitor, and then a lifting plate is lifted through a lifting air cylinder to enable the to-be-tested capacitor to be in a suspended state for testing; the discharging device comprises a material distributing mechanism and a material receiving mechanism, the material distributing mechanism is used for placing the tested capacitors on the testing rotating disc into the material collecting grooves in the</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230418&amp;DB=EPODOC&amp;CC=CN&amp;NR=115980392A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230418&amp;DB=EPODOC&amp;CC=CN&amp;NR=115980392A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TANG JIEXIANG</creatorcontrib><creatorcontrib>LIANG XIUGANG</creatorcontrib><creatorcontrib>YU WENLIN</creatorcontrib><title>Chip capacitor testing machine</title><description>The invention discloses a chip capacitor testing machine. The chip capacitor testing machine comprises a feeding device, a testing device and a discharging device. The feeding device comprises a feeding mechanism and a conveying mechanism, the feeding mechanism is used for storing to-be-tested capacitors, and the conveying mechanism is used for conveying the to-be-tested capacitors of the feeding mechanism; the testing device comprises a turntable mechanism and a testing mechanism, a testing motor drives a plurality of transmission parts to move synchronously to enable a testing needle to clamp a to-be-tested capacitor, and then a lifting plate is lifted through a lifting air cylinder to enable the to-be-tested capacitor to be in a suspended state for testing; the discharging device comprises a material distributing mechanism and a material receiving mechanism, the material distributing mechanism is used for placing the tested capacitors on the testing rotating disc into the material collecting grooves in the</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJBzzsgsUEhOLEhMzizJL1IoSS0uycxLV8hNTM7IzEvlYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxUBdqXmpJfHOfoaGppYWBsaWRo7GxKgBAPKZJH4</recordid><startdate>20230418</startdate><enddate>20230418</enddate><creator>TANG JIEXIANG</creator><creator>LIANG XIUGANG</creator><creator>YU WENLIN</creator><scope>EVB</scope></search><sort><creationdate>20230418</creationdate><title>Chip capacitor testing machine</title><author>TANG JIEXIANG ; LIANG XIUGANG ; YU WENLIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN115980392A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TANG JIEXIANG</creatorcontrib><creatorcontrib>LIANG XIUGANG</creatorcontrib><creatorcontrib>YU WENLIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TANG JIEXIANG</au><au>LIANG XIUGANG</au><au>YU WENLIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Chip capacitor testing machine</title><date>2023-04-18</date><risdate>2023</risdate><abstract>The invention discloses a chip capacitor testing machine. The chip capacitor testing machine comprises a feeding device, a testing device and a discharging device. The feeding device comprises a feeding mechanism and a conveying mechanism, the feeding mechanism is used for storing to-be-tested capacitors, and the conveying mechanism is used for conveying the to-be-tested capacitors of the feeding mechanism; the testing device comprises a turntable mechanism and a testing mechanism, a testing motor drives a plurality of transmission parts to move synchronously to enable a testing needle to clamp a to-be-tested capacitor, and then a lifting plate is lifted through a lifting air cylinder to enable the to-be-tested capacitor to be in a suspended state for testing; the discharging device comprises a material distributing mechanism and a material receiving mechanism, the material distributing mechanism is used for placing the tested capacitors on the testing rotating disc into the material collecting grooves in the</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Chip capacitor testing machine
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