Chip capacitor testing machine

The invention discloses a chip capacitor testing machine. The chip capacitor testing machine comprises a feeding device, a testing device and a discharging device. The feeding device comprises a feeding mechanism and a conveying mechanism, the feeding mechanism is used for storing to-be-tested capacitors, and the conveying mechanism is used for conveying the to-be-tested capacitors of the feeding mechanism; the testing device comprises a turntable mechanism and a testing mechanism, a testing motor drives a plurality of transmission parts to move synchronously to enable a testing needle to clamp a to-be-tested capacitor, and then a lifting plate is lifted through a lifting air cylinder to enable the to-be-tested capacitor to be in a suspended state for testing; the discharging device comprises a material distributing mechanism and a material receiving mechanism, the material distributing mechanism is used for placing the tested capacitors on the testing rotating disc into the material collecting grooves in the