Chip testing device and chip testing system

The invention discloses a chip testing device and a chip testing system, the chip testing device comprises a shell and a temperature equalizing plate, the temperature equalizing plate is arranged in the shell and divides the space in the shell into a first cavity and a second cavity, and the second cavity is used for placing a chip to be tested; the position of the uniform temperature plate in the shell is adjustable, so that the space size of the second cavity can be adjusted according to the number of the to-be-tested chips, and the chip testing device can be suitable for small-batch testing. Besides, when the number of the chips to be tested is small, the space adaptability of the second cavity is reduced, the time for reaching the temperature required by the test is short, the energy consumption is reduced, and the economical efficiency is high. 本申请公开了一种芯片测试装置和芯片测试系统，芯片测试装置包括壳体和均温板，均温板设于壳体内并将壳体内的空间分隔为第一空腔和第二空腔，第二空腔用于放置待测试芯片；均温板在所述壳体内的位置可调，使得可以根据待测试芯片的数量多少调节第二空腔的空间大小，进而使得芯片测试装置可以适用于小批量的测试。另外，当待测试芯片的数量较少时，将