Line defect inspection device
The present invention relates to a thread defect inspection apparatus, and a thread defect inspection apparatus related to one example according to the present invention, which can store a defect image at a low volume for a long period of time, and can determine a thread-like stain defect by compari...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Schreiben Sie den ersten Kommentar!