Line defect inspection device

The present invention relates to a thread defect inspection apparatus, and a thread defect inspection apparatus related to one example according to the present invention, which can store a defect image at a low volume for a long period of time, and can determine a thread-like stain defect by compari...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LI QINGTAO, GAO YONGYU, PARK JAE-HYUN, YANG MYOUNG-GON
Format: Patent
Sprache:chi ; eng
Schlagworte:
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