Line defect inspection device
The present invention relates to a thread defect inspection apparatus, and a thread defect inspection apparatus related to one example according to the present invention, which can store a defect image at a low volume for a long period of time, and can determine a thread-like stain defect by compari...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The present invention relates to a thread defect inspection apparatus, and a thread defect inspection apparatus related to one example according to the present invention, which can store a defect image at a low volume for a long period of time, and can determine a thread-like stain defect by comparing an entire fabric image. In addition, according to a line defect inspection apparatus related to one example of the present invention, images stored by respective cameras are combined so as to be stored as one image in an image mapping server, and thus line stain defects in a fabric can be managed.
本发明涉及一种线缺陷检查装置,并且与根据本发明的一个示例有关的线缺陷检查装置,缺陷图像可以以低容量长时间储存,并且通过比较整个织物图像可以确定线状污渍缺陷。另外,根据与本发明的一个示例有关的线缺陷检查装置,由各个摄像机储存的图像被结合以便作为一个图像储存在图像映射服务器中,并且因此织物中的线状污渍缺陷可以被管理。 |
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