Device for measuring seepage path of interlayer of horizontal ellipsoidal reservoir, use method and leakage rate calculation method

The invention discloses a device for measuring the seepage path of a horizontal ellipsoidal reservoir interlayer, a use method and a leakage amount calculation method. The device comprises a gas tracer input port and an output rod piece, and the output rod piece comprises a telescopic pipe fitting,...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: ZHAO PENGFEI, WANG XIAOPENG, WANG JUNBAO, LIU XIAO, ZHANG WEN, JIANG HENGKUN
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!