Device for measuring seepage path of interlayer of horizontal ellipsoidal reservoir, use method and leakage rate calculation method
The invention discloses a device for measuring the seepage path of a horizontal ellipsoidal reservoir interlayer, a use method and a leakage amount calculation method. The device comprises a gas tracer input port and an output rod piece, and the output rod piece comprises a telescopic pipe fitting,...
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Format: | Patent |
Sprache: | chi ; eng |
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