Device for measuring seepage path of interlayer of horizontal ellipsoidal reservoir, use method and leakage rate calculation method

The invention discloses a device for measuring the seepage path of a horizontal ellipsoidal reservoir interlayer, a use method and a leakage amount calculation method. The device comprises a gas tracer input port and an output rod piece, and the output rod piece comprises a telescopic pipe fitting,...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: ZHAO PENGFEI, WANG XIAOPENG, WANG JUNBAO, LIU XIAO, ZHANG WEN, JIANG HENGKUN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a device for measuring the seepage path of a horizontal ellipsoidal reservoir interlayer, a use method and a leakage amount calculation method. The device comprises a gas tracer input port and an output rod piece, and the output rod piece comprises a telescopic pipe fitting, a storage platform and a gas tracer output pipe; the telescopic pipe fitting is adopted, different positions of the gas storage interlayer can be met, it is guaranteed that the output rod piece can rotate along the argillaceous interlayer of the horizontal ellipsoidal storage cavern, and the purposes that the gas tracer agent is evenly smeared on the periphery of the argillaceous interlayer of the horizontal ellipsoidal storage cavern by a circle, and it is guaranteed that the gas tracer agent can be evenly spread on the periphery of the argillaceous interlayer of the horizontal ellipsoidal storage cavern by a circle are achieved. The gas seepage causes the gas tracer to move, so that the position information of th