Three-dimensional measurement method, device and equipment based on binocular imaging and storage medium
The invention relates to a three-dimensional measurement technology, and discloses a three-dimensional measurement method based on binocular imaging, which comprises the following steps: carrying out site configuration around an object to be measured to obtain a structured light system, and shooting...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a three-dimensional measurement technology, and discloses a three-dimensional measurement method based on binocular imaging, which comprises the following steps: carrying out site configuration around an object to be measured to obtain a structured light system, and shooting the object to be measured under illumination projection one by one by using a binocular camera to obtain a binocular image set; calculating a distortion parameter set corresponding to the binocular image sets, and performing distortion correction on all the binocular image sets to obtain a standard binocular image set; extracting features of the standard binocular image set to obtain a feature point set, and performing feature point matching on the standard binocular image set to obtain a parallax image set corresponding to the standard binocular image set; and converting the standard binocular image set into a point location point cloud set according to the parallax image set, performing coordinate axis conversio |
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