Three-dimensional measurement method, device and equipment based on binocular imaging and storage medium

The invention relates to a three-dimensional measurement technology, and discloses a three-dimensional measurement method based on binocular imaging, which comprises the following steps: carrying out site configuration around an object to be measured to obtain a structured light system, and shooting...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: ZENG GUOZHI, ZHANG YONGFENG
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The invention relates to a three-dimensional measurement technology, and discloses a three-dimensional measurement method based on binocular imaging, which comprises the following steps: carrying out site configuration around an object to be measured to obtain a structured light system, and shooting the object to be measured under illumination projection one by one by using a binocular camera to obtain a binocular image set; calculating a distortion parameter set corresponding to the binocular image sets, and performing distortion correction on all the binocular image sets to obtain a standard binocular image set; extracting features of the standard binocular image set to obtain a feature point set, and performing feature point matching on the standard binocular image set to obtain a parallax image set corresponding to the standard binocular image set; and converting the standard binocular image set into a point location point cloud set according to the parallax image set, performing coordinate axis conversio