Single-stage equipment defect identification method and device

The embodiment of the invention provides a single-stage equipment defect identification method and device, and belongs to the technical field of power equipment operation and maintenance. The identification method comprises the following steps: acquiring a to-be-identified equipment picture in a clo...

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Hauptverfasser: YANG NAIQI, CHEN YING, ZHU ZHONGXIAN, GUO LONGGANG, WEI NAN, ZHU YUANFU, GUO ZHENYU, WANG YUN, CAI KEWEI, WENG LING, MA HUAN, PU DAOJIE, DU YAO, CHANG WENJING, DU PENG, LIU XIN, WU XIANG, SHEN GUOTANG, SHI WEN, WANG WEIWEI, HUANG DAOJUN, XU MENGFU, ZANG CHUNHUA, LIU WENTAO, SHAO HUA, ZHANG XUEYOU
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The embodiment of the invention provides a single-stage equipment defect identification method and device, and belongs to the technical field of power equipment operation and maintenance. The identification method comprises the following steps: acquiring a to-be-identified equipment picture in a close-shot state; decoloring operation is carried out on the equipment picture; sequentially executing at least three times of first convolution operation on the decolored equipment picture; sequentially executing a second convolution operation and a pooling operation on the equipment picture after executing the first convolution operations for three times; executing a first matrix multiplication operation on the equipment picture subjected to the three times of first convolution operations and the equipment picture subjected to the pooling operation; performing global average pooling operation on the equipment picture after the first matrix multiplication operation; executing a second convolution operation on the dev