Multi-measuring-position parallel testing and sorting device for power management chip

The invention is suitable for the technical field of power management chip testing and sorting, and provides a power management chip multi-measuring-position parallel testing and sorting device which comprises a base, two feeding assemblies are symmetrically installed on the top of the base, locking...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: ZHU XIANGUANG, WANG LU, WU JUN
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The invention is suitable for the technical field of power management chip testing and sorting, and provides a power management chip multi-measuring-position parallel testing and sorting device which comprises a base, two feeding assemblies are symmetrically installed on the top of the base, locking mechanisms are installed on the opposite sides of the two feeding assemblies, a swing assembly is installed on the top of the base, and the swing assembly is connected with a power management chip. A swing assembly is installed on the base, an adjusting mechanism is installed on one side of the swing assembly, the adjusting mechanism is located between the two feeding assemblies, two testing mechanisms are installed on the top of the base and located below the two feeding assemblies, each feeding assembly comprises a support, the supports are installed on the top of the base, and the supports are arranged on the top of the base. Main rails are evenly installed at the top of the support, chips are arranged in the m