Parallel test system and method, electronic equipment and storage medium
The embodiment of the invention discloses a parallel test system and method, electronic equipment and a storage medium. The system comprises a test host and N tested devices, and N is an integer greater than 1; the test host is provided with at least N host IP addresses belonging to different networ...
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The embodiment of the invention discloses a parallel test system and method, electronic equipment and a storage medium. The system comprises a test host and N tested devices, and N is an integer greater than 1; the test host is provided with at least N host IP addresses belonging to different network segments; each piece of tested equipment in the N pieces of tested equipment is provided with at least N virtual IP addresses belonging to different network segments; the test host is set to respectively communicate with the N tested devices through the N host IP addresses so as to execute a test task; wherein when the test host communicates with the tested equipment, the network segment to which the virtual IP address adopted by the ith tested equipment belongs is the same as the network segment to which the IP address of the ith host belongs. According to the parallel test scheme provided by the embodiment of the invention, the parallel test can be simply and efficiently carried out on the tested equipment, com |
---|