Comprehensive signal test platform and test method
The invention relates to the field of signal testing, in particular to a signal testing platform used for FPGA program testing and based on an ARM and an FPGA and a corresponding comprehensive signal testing method, random original data are generated at the ARM end in a multi-thread mode and sent to...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to the field of signal testing, in particular to a signal testing platform used for FPGA program testing and based on an ARM and an FPGA and a corresponding comprehensive signal testing method, random original data are generated at the ARM end in a multi-thread mode and sent to the FPGA, the random original data are processed through a program to be tested on an FPGA platform and pass through an AWGN Gaussian white noise channel, and the random original data are transmitted to the FPGA. And a test result is transmitted back to the ARM end, so that the frame error rate and bit error rate test of a large data volume is realized. Meanwhile, through joint flow control of the ARM end and the FPGA end, it is guaranteed that the system transmits data at the maximum rate under the condition that data are not lost; and the ARM end divides original data sending and decoding result receiving into two threads, so that the idle time of the ARM can be greatly reduced, and the working efficiency of the |
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