Electron microscope image processing method and device, electronic equipment and storage medium
The invention relates to an electron microscope image processing method and device, electronic equipment and a storage medium, and the method comprises the steps: carrying out the rasterization processing of a target electron microscope image, and obtaining a plurality of grid regions; and determini...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to an electron microscope image processing method and device, electronic equipment and a storage medium, and the method comprises the steps: carrying out the rasterization processing of a target electron microscope image, and obtaining a plurality of grid regions; and determining a three-dimensional curved surface corresponding to the target electron microscope image according to the pixel value in each grid region, and extracting local poles in the three-dimensional curved surface. A contour map of the three-dimensional curved surface is drawn according to the reference plane and each local pole, the positions of different image information in the target electron microscope image are determined according to the contour map, and the image information comprises particle features, image backgrounds and other interference information. According to the method and the device, the three-dimensional curved surface is generated by performing rasterization processing on the electron microscope im |
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