Material sampling inspection method and device based on LightGBM index model

The invention relates to an artificial intelligence technology, and discloses a material sampling inspection method and device based on a LightGBM index model, and the method comprises the steps: carrying out the data cleaning of the source data of a material supplier, and obtaining the standard dat...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LIANG LIJIANG, ZHENG JINGNAN, JIANG LEI, LIN KAI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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