Material sampling inspection method and device based on LightGBM index model

The invention relates to an artificial intelligence technology, and discloses a material sampling inspection method and device based on a LightGBM index model, and the method comprises the steps: carrying out the data cleaning of the source data of a material supplier, and obtaining the standard data; according to a preset objective function, configuring the obtained LightGBM index model to be constructed to obtain an initial LightGBM index model; training the initial LightGBM index model by using the standard data to obtain a training result of the initial LightGBM index model; generating evaluation parameters of the initial LightGBM index model according to a training result, and performing parameter optimization on the initial LightGBM index model by using the evaluation parameters to obtain a trained LightGBM index model; and generating a casual inspection qualified list of the material supplier by using the trained LightGBM index model. The accuracy of casual inspection of materials can be improved. 本发明涉