Part defect detection method and related device
The invention discloses a part defect detection method and a related device, which are used for detecting a to-be-detected part comprising a plurality of detected surfaces. The controller is applied to the part defect detection system, and the part defect detection system further comprises an image...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a part defect detection method and a related device, which are used for detecting a to-be-detected part comprising a plurality of detected surfaces. The controller is applied to the part defect detection system, and the part defect detection system further comprises an image acquisition device, an illumination device and a turnover mechanism. And an overturning instruction is sent to the overturning mechanism, and the overturning mechanism adjusts the detected surface of the to-be-detected part according to the overturning instruction. A shooting instruction is sent to the image acquisition device, and in the process that the illumination device illuminates the to-be-detected part, the image acquisition device shoots an image of the current detected surface of the to-be-detected part according to the shooting instruction. And acquiring the image, and determining whether the detected surfaces have defects according to the image until the plurality of detected surfaces included in the to |
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