Momentum filtering system and method for measuring exciton polariton interaction constant

The invention discloses a momentum filtering system which comprises a pulse laser, and laser of the pulse laser passes through a first semi-reflecting and semi-transmitting mirror, a first silver-plated plane mirror, a second silver-plated plane mirror, a second semi-reflecting and semi-transmitting...

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Bibliographische Detailangaben
Hauptverfasser:	WANG CHENSHENG, YU HUI, DU WEICHAO, CHENG PIAO, TIAN CHUAN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING
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Beschreibung
Zusammenfassung:	The invention discloses a momentum filtering system which comprises a pulse laser, and laser of the pulse laser passes through a first semi-reflecting and semi-transmitting mirror, a first silver-plated plane mirror, a second silver-plated plane mirror, a second semi-reflecting and semi-transmitting mirror and an ultraviolet microscope objective and then reaches a zinc oxide single crystal microrod. A light barrier is arranged between the second silver-plated plane mirror and the second semi-reflecting and semi-transmitting mirror; laser of the pulse laser passes through the first semi-reflecting and semi-transmitting mirror, the second semi-reflecting and semi-transmitting mirror and the ultraviolet microscope objective and then reaches the zinc oxide single crystal microrod; a signal on the zinc oxide single crystal microrod is transmitted to a data processing system through the ultraviolet microscope objective, the second semi-reflecting and semi-transmitting mirror, the first semi-reflecting and semi-tran