Material sampling inspection method and device based on distributed material supply
The invention relates to a material sampling inspection technology, and discloses a material sampling inspection method and device based on distributed material supply, and the method comprises the steps: obtaining the standard historical material data of a target supplier one by one; historical mat...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a material sampling inspection technology, and discloses a material sampling inspection method and device based on distributed material supply, and the method comprises the steps: obtaining the standard historical material data of a target supplier one by one; historical material residual features, historical material period features and historical material trend features are extracted from the standard historical material data; respectively calculating a time sequence material residual value, a time sequence material period value and a time sequence material trend value, calculating a time sequence material analysis value, and performing iterative optimization on the time sequence analysis model according to the time sequence material analysis value to obtain a standard analysis model corresponding to the target supplier; and acquiring real-time material data corresponding to the target supplier, analyzing the real-time material data by using the standard analysis model to obtain a t |
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