FPM super-resolution microscope system based on rotating lens and mark positioning

The invention discloses an FPM super-resolution microscope system based on a rotating lens and mark positioning. The FPM super-resolution microscope system comprises a rotating mechanism with a pitching angle adjusting part; the objective table is provided with a positioning mark part and carries a...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LU XIAOYIN, GUI XUN, WEI YE, QIN SHAOQIAN, GUO JIE
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses an FPM super-resolution microscope system based on a rotating lens and mark positioning. The FPM super-resolution microscope system comprises a rotating mechanism with a pitching angle adjusting part; the objective table is provided with a positioning mark part and carries a sample; the objective lens and the electronic eyepiece are integrally mounted on the rotating mechanism and rotate along with the rotating mechanism; wherein the central axis of the rotating mechanism vertically penetrates through the center of the objective table, the rotating mechanism rotates around the central axis to enable the objective lens and the electronic eyepiece to do circular motion with the central axis as the center and form an imaging view field, and at least four positioning marks in the positioning mark part are located in the imaging view field. An objective lens and an electronic eyepiece are carried through a designed rotating mechanism, the electronic eyepiece can rotate around the central ax