Magnetic field measurement method based on atomic spin magnetic resonance

The invention provides a magnetic field measurement method based on atomic spin magnetic resonance. The magnetic field measurement method comprises the following steps: carrying out equal-power light splitting on a polarized light beam and then respectively polarizing the polarized light beam into l...

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Bibliographische Detailangaben
Hauptverfasser: LIU DONGSU, QIN JIE, GUO YUHAO, LIU XIANG, WAN SHUANG'AI, XUE SHUAI, ZHOU MING, WEI KEQUAN
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention provides a magnetic field measurement method based on atomic spin magnetic resonance. The magnetic field measurement method comprises the following steps: carrying out equal-power light splitting on a polarized light beam and then respectively polarizing the polarized light beam into left-hand circularly polarized light and right-hand circularly polarized light; adjusting the wavelength of the polarized light beam to be at an atomic transition frequency, enabling the left-hand circularly polarized light to enter a first photoelectric detector after penetrating through the atomic gas chamber, enabling the right-hand circularly polarized light to enter a second photoelectric detector after penetrating through the atomic gas chamber, applying an excitation magnetic field to the atomic gas chamber, and scanning the excitation magnetic field frequency in a set frequency interval of magnetic resonance frequency, constructing a differential magnetic resonance curve by taking the differential optical po