Quality defect prediction method based on data coupling micro-feature correlation analysis
The invention discloses a quality defect prediction method based on data coupling micro-feature correlation analysis, and the method comprises the steps: carrying out the interval division of quality feature coupling data through constructing a data coupling micro-feature correlation analysis method...
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creator | HAN CHENGRUI CHEN LAIXIAN LIM JEONG-WOOK TIAN YIDUO REN XIANLIN |
description | The invention discloses a quality defect prediction method based on data coupling micro-feature correlation analysis, and the method comprises the steps: carrying out the interval division of quality feature coupling data through constructing a data coupling micro-feature correlation analysis method, recognizing the incidence relation between the quality feature coupling data, extracting the significant defect feature data through the confidence threshold value, and carrying out the prediction of the quality defect. And building a manufacturing process quality defect prediction model based on a coupling data micro-feature correlation rule, and completing prediction of quality defects. According to the method, the manufacturing quality can be predicted in real time, key quality characteristic data causing output quality defects and manufacturing process multivariate input parameters having influence on the quality characteristics are analyzed and predicted, quality decoupling of multivariate quality characteri |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN115718864A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN115718864A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN115718864A3</originalsourceid><addsrcrecordid>eNqNi70KwjAURrs4iPoO1wfoEPzrKkVxEgQnl3JNvmogTUJyM_TtLeIDOH2cw_nm1eNW2FkZyaCHFooJxmqxwdMAeQdDT84wNLFhYdKhRGf9iwarU6h7sJSESacEx98fe3ZjtnlZzXp2GavfLqr1-XRvLzVi6JAja3hI116V2h1U0-y3x80_zQdj3jup</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Quality defect prediction method based on data coupling micro-feature correlation analysis</title><source>esp@cenet</source><creator>HAN CHENGRUI ; CHEN LAIXIAN ; LIM JEONG-WOOK ; TIAN YIDUO ; REN XIANLIN</creator><creatorcontrib>HAN CHENGRUI ; CHEN LAIXIAN ; LIM JEONG-WOOK ; TIAN YIDUO ; REN XIANLIN</creatorcontrib><description>The invention discloses a quality defect prediction method based on data coupling micro-feature correlation analysis, and the method comprises the steps: carrying out the interval division of quality feature coupling data through constructing a data coupling micro-feature correlation analysis method, recognizing the incidence relation between the quality feature coupling data, extracting the significant defect feature data through the confidence threshold value, and carrying out the prediction of the quality defect. And building a manufacturing process quality defect prediction model based on a coupling data micro-feature correlation rule, and completing prediction of quality defects. According to the method, the manufacturing quality can be predicted in real time, key quality characteristic data causing output quality defects and manufacturing process multivariate input parameters having influence on the quality characteristics are analyzed and predicted, quality decoupling of multivariate quality characteri</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS ; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230228&DB=EPODOC&CC=CN&NR=115718864A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230228&DB=EPODOC&CC=CN&NR=115718864A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HAN CHENGRUI</creatorcontrib><creatorcontrib>CHEN LAIXIAN</creatorcontrib><creatorcontrib>LIM JEONG-WOOK</creatorcontrib><creatorcontrib>TIAN YIDUO</creatorcontrib><creatorcontrib>REN XIANLIN</creatorcontrib><title>Quality defect prediction method based on data coupling micro-feature correlation analysis</title><description>The invention discloses a quality defect prediction method based on data coupling micro-feature correlation analysis, and the method comprises the steps: carrying out the interval division of quality feature coupling data through constructing a data coupling micro-feature correlation analysis method, recognizing the incidence relation between the quality feature coupling data, extracting the significant defect feature data through the confidence threshold value, and carrying out the prediction of the quality defect. And building a manufacturing process quality defect prediction model based on a coupling data micro-feature correlation rule, and completing prediction of quality defects. According to the method, the manufacturing quality can be predicted in real time, key quality characteristic data causing output quality defects and manufacturing process multivariate input parameters having influence on the quality characteristics are analyzed and predicted, quality decoupling of multivariate quality characteri</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><subject>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNi70KwjAURrs4iPoO1wfoEPzrKkVxEgQnl3JNvmogTUJyM_TtLeIDOH2cw_nm1eNW2FkZyaCHFooJxmqxwdMAeQdDT84wNLFhYdKhRGf9iwarU6h7sJSESacEx98fe3ZjtnlZzXp2GavfLqr1-XRvLzVi6JAja3hI116V2h1U0-y3x80_zQdj3jup</recordid><startdate>20230228</startdate><enddate>20230228</enddate><creator>HAN CHENGRUI</creator><creator>CHEN LAIXIAN</creator><creator>LIM JEONG-WOOK</creator><creator>TIAN YIDUO</creator><creator>REN XIANLIN</creator><scope>EVB</scope></search><sort><creationdate>20230228</creationdate><title>Quality defect prediction method based on data coupling micro-feature correlation analysis</title><author>HAN CHENGRUI ; CHEN LAIXIAN ; LIM JEONG-WOOK ; TIAN YIDUO ; REN XIANLIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN115718864A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><topic>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>HAN CHENGRUI</creatorcontrib><creatorcontrib>CHEN LAIXIAN</creatorcontrib><creatorcontrib>LIM JEONG-WOOK</creatorcontrib><creatorcontrib>TIAN YIDUO</creatorcontrib><creatorcontrib>REN XIANLIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HAN CHENGRUI</au><au>CHEN LAIXIAN</au><au>LIM JEONG-WOOK</au><au>TIAN YIDUO</au><au>REN XIANLIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Quality defect prediction method based on data coupling micro-feature correlation analysis</title><date>2023-02-28</date><risdate>2023</risdate><abstract>The invention discloses a quality defect prediction method based on data coupling micro-feature correlation analysis, and the method comprises the steps: carrying out the interval division of quality feature coupling data through constructing a data coupling micro-feature correlation analysis method, recognizing the incidence relation between the quality feature coupling data, extracting the significant defect feature data through the confidence threshold value, and carrying out the prediction of the quality defect. And building a manufacturing process quality defect prediction model based on a coupling data micro-feature correlation rule, and completing prediction of quality defects. According to the method, the manufacturing quality can be predicted in real time, key quality characteristic data causing output quality defects and manufacturing process multivariate input parameters having influence on the quality characteristics are analyzed and predicted, quality decoupling of multivariate quality characteri</abstract><oa>free_for_read</oa></addata></record> |
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subjects | CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR |
title | Quality defect prediction method based on data coupling micro-feature correlation analysis |
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