Quality defect prediction method based on data coupling micro-feature correlation analysis

The invention discloses a quality defect prediction method based on data coupling micro-feature correlation analysis, and the method comprises the steps: carrying out the interval division of quality feature coupling data through constructing a data coupling micro-feature correlation analysis method...

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Hauptverfasser: HAN CHENGRUI, CHEN LAIXIAN, LIM JEONG-WOOK, TIAN YIDUO, REN XIANLIN
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a quality defect prediction method based on data coupling micro-feature correlation analysis, and the method comprises the steps: carrying out the interval division of quality feature coupling data through constructing a data coupling micro-feature correlation analysis method, recognizing the incidence relation between the quality feature coupling data, extracting the significant defect feature data through the confidence threshold value, and carrying out the prediction of the quality defect. And building a manufacturing process quality defect prediction model based on a coupling data micro-feature correlation rule, and completing prediction of quality defects. According to the method, the manufacturing quality can be predicted in real time, key quality characteristic data causing output quality defects and manufacturing process multivariate input parameters having influence on the quality characteristics are analyzed and predicted, quality decoupling of multivariate quality characteri