Large-view-field 3D profile measuring instrument calibration method based on Scheimpflug law

The invention discloses a large-field-of-view 3D profile measuring instrument calibration method based on the Scheimpflug law, and the method comprises the steps: constructing a first image collection model based on the Scheimpflug law, obtaining a first conversion model between the pixel coordinates of a checkerboard angular point and the world coordinates, decomposing the first conversion model to obtain the initial calibration parameters of a 3D profile measuring instrument, and carrying out the calibration of the 3D profile measuring instrument. And then obtaining a deflection value and a deviation value of the 3D contour measuring instrument to construct a second image acquisition model, obtaining a second conversion model between pixel coordinates of checkerboard angular points and world coordinates, and obtaining calibration parameters of the 3D contour measuring instrument based on the first conversion model and the second conversion model in combination with initial calibration parameters of the 3D c