Simulation signal test circuit, test method, test equipment and storage medium
The embodiment of the invention provides a simulation signal test circuit, a test method, test equipment and a storage medium. The simulation signal test circuit comprises a logic operation unit which is provided with a first input end, a second input end and a first output end, the first input end...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The embodiment of the invention provides a simulation signal test circuit, a test method, test equipment and a storage medium. The simulation signal test circuit comprises a logic operation unit which is provided with a first input end, a second input end and a first output end, the first input end is used for receiving a noise signal for simulating a target circuit, and the second input end is used for receiving an excitation signal for simulating the target circuit; the logical operation unit is used for performing logical operation on the noise signal and the excitation signal to obtain a simulation signal for the target circuit; the first output end is used for providing the simulation signal for the target circuit. According to the embodiment of the invention, the simulation signal can be quickly generated.
本公开实施例提供一种仿真信号测试电路、测试方法、测试设备及存储介质。该仿真信号测试电路包括:逻辑运算单元,其具有第一输入端、第二输入端以及第一输出端,其中,所述第一输入端用于接收针对目标电路进行仿真的噪声信号,所述第二输入端用于接收针对所述目标电路进行仿真的激励信号;所述逻辑运算单元用于对所述噪声信号和所述激励信号进行逻辑运算,得到针对所述目标电路的仿真信号;所述第一输出端用于向所述目标电路提供所 |
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