Radiation effect research test device and method

The invention provides a radiation effect research test device and a radiation effect research test method, and solves the problems of heat waste caused by an overlarge heating chuck in the existing high-temperature radiation test process and overlong heat dissipation time caused by an overlarge are...

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Hauptverfasser: GUO HONGXIA, MA WUYING, GOU SHILONG, HE BAOPING, OUYANG XIAOPING, YAO ZHIBIN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention provides a radiation effect research test device and a radiation effect research test method, and solves the problems of heat waste caused by an overlarge heating chuck in the existing high-temperature radiation test process and overlong heat dissipation time caused by an overlarge area of the heating chuck, so that part of defects are annealed in the heat dissipation process of the heating chuck; and finally, the accurate measurement of the effect rule is seriously influenced, and the analysis of the total dose effect rule is hindered. The device comprises a base, a heating sheet, a thermocouple, a fixing clamp, a temperature monitoring device, a power supply and a plurality of supporting columns, one end of each pillar is connected with the fixed base, and the other end is fixedly connected with the heating sheet; the fixing clamp is positioned on the heating sheet; the input end of the thermocouple is connected with the heating sheet, and the output end of the thermocouple is connected with t