SEMICONDUCTOR IMAGE SENSING DEVICE AND METHOD OF MANUFACTURING THE SAME
The embodiment of the invention discloses a semiconductor image sensor device and a method of manufacturing the same. The semiconductor image sensing device includes a substrate, first and second pixels, and an isolation structure. A first pixel and a second pixel are disposed in a substrate, where...
Gespeichert in:
Hauptverfasser: | , , , , , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The embodiment of the invention discloses a semiconductor image sensor device and a method of manufacturing the same. The semiconductor image sensing device includes a substrate, first and second pixels, and an isolation structure. A first pixel and a second pixel are disposed in a substrate, where the first and second pixels are adjacent pixels. An isolation structure is disposed in the substrate and between the first and second pixels, where the isolation structure includes a dielectric layer, and the dielectric layer includes silicon oxycarbonitride (SiOCN).
本发明的实施例公开了半导体图像传感器件及其制造方法。半导体图像传感器件包括衬底、第一像素和第二像素、以及隔离结构。第一像素和第二像素设置在衬底中,其中,第一和第二像素为相邻像素。隔离结构设置在衬底中并且介于第一和第二像素之间,其中,隔离结构包括介电层,并且介电层包括碳氧氮化硅(SiOCN)。 |
---|