Defect detection method and device, computer equipment and storage medium

The invention discloses a defect detection method and device, computer equipment and a storage medium, and relates to the technical field of computers. The method comprises the following steps: acquiring a plurality of segmented images of a to-be-detected product, wherein the segmented images refer to partial images of the surface of the to-be-detected product; respectively carrying out defect detection on the plurality of segmented images to obtain defect detection results of the plurality of segmented images; and synthesizing the defect detection results of the plurality of segmented images to obtain a defect detection result of the surface of the to-be-detected product. According to the invention, the defect detection efficiency can be improved. 本申请公开了一种缺陷检测方法、装置、计算机设备及存储介质，涉及计算机技术领域。方法包括：获取待检测产品的多个分段图像，其中分段图像是指待检测产品的表面的部分图像；对多个分段图像分别进行缺陷检测，得到多个分段图像的缺陷检测结果；对多个分段图像的缺陷检测结果进行合成，以得到待检测产品的表面的缺陷检测结果。采用本申请，能够提高缺陷检测效率。