Super-large scale infrared detector test Dewar
The invention discloses a super-large-scale infrared detector test Dewar which comprises a vacuum system, a refrigeration system, a temperature measurement and control system and a black body system. The vacuum system is used for providing a vacuum environment required by testing; the refrigerating...
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| creator | YAO YAO DAI LIQUN XIE LILI CHAI RUIQING XU SHENGYA FAN BEN XIE SHENGWEN WANG YUE HE SHAODONG SUN QIYANG WANG GENGYUN |
| description | The invention discloses a super-large-scale infrared detector test Dewar which comprises a vacuum system, a refrigeration system, a temperature measurement and control system and a black body system. The vacuum system is used for providing a vacuum environment required by testing; the refrigerating system is used for providing a mounting platform, a low-temperature cold source and a low-temperature cold background environment for the detector; the temperature measurement and control system is used for monitoring the temperature of each component and controlling the temperature of the refrigerating system; and the blackbody system is used for providing a signal source for the photoelectric performance test of the detector. According to the invention, the problem of testing the photoelectric performance of the super-large-scale spliced infrared detector is solved.
本发明公开了一种超大规模红外探测器测试杜瓦，包括：真空系统、制冷系统、测控温系统和黑体系统；真空系统，用于提供测试所需的真空环境；制冷系统，用于为探测器提供安装平台、低温冷源和低温冷背景环境；测控温系统，用于监测各部件温度、控制制冷系统温度；黑体系统，用于为探测器的光电性能测试提供信号源。本发明解 |
| format | Patent |
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本发明公开了一种超大规模红外探测器测试杜瓦，包括：真空系统、制冷系统、测控温系统和黑体系统；真空系统，用于提供测试所需的真空环境；制冷系统，用于为探测器提供安装平台、低温冷源和低温冷背景环境；测控温系统，用于监测各部件温度、控制制冷系统温度；黑体系统，用于为探测器的光电性能测试提供信号源。本发明解</description><language>chi ; eng</language><subject>COLORIMETRY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230131&DB=EPODOC&CC=CN&NR=115655489A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230131&DB=EPODOC&CC=CN&NR=115655489A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YAO YAO</creatorcontrib><creatorcontrib>DAI LIQUN</creatorcontrib><creatorcontrib>XIE LILI</creatorcontrib><creatorcontrib>CHAI RUIQING</creatorcontrib><creatorcontrib>XU SHENGYA</creatorcontrib><creatorcontrib>FAN BEN</creatorcontrib><creatorcontrib>XIE SHENGWEN</creatorcontrib><creatorcontrib>WANG YUE</creatorcontrib><creatorcontrib>HE SHAODONG</creatorcontrib><creatorcontrib>SUN QIYANG</creatorcontrib><creatorcontrib>WANG GENGYUN</creatorcontrib><title>Super-large scale infrared detector test Dewar</title><description>The invention discloses a super-large-scale infrared detector test Dewar which comprises a vacuum system, a refrigeration system, a temperature measurement and control system and a black body system. The vacuum system is used for providing a vacuum environment required by testing; the refrigerating system is used for providing a mounting platform, a low-temperature cold source and a low-temperature cold background environment for the detector; the temperature measurement and control system is used for monitoring the temperature of each component and controlling the temperature of the refrigerating system; and the blackbody system is used for providing a signal source for the photoelectric performance test of the detector. According to the invention, the problem of testing the photoelectric performance of the super-large-scale spliced infrared detector is solved.
本发明公开了一种超大规模红外探测器测试杜瓦，包括：真空系统、制冷系统、测控温系统和黑体系统；真空系统，用于提供测试所需的真空环境；制冷系统，用于为探测器提供安装平台、低温冷源和低温冷背景环境；测控温系统，用于监测各部件温度、控制制冷系统温度；黑体系统，用于为探测器的光电性能测试提供信号源。本发明解</description><subject>COLORIMETRY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNALLi1ILdLNSSxKT1UoTk7MSVXIzEsrSixKTVFISS1JTS7JL1IoSS0uUXBJLU8s4mFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hoamZqamJhaWjsbEqAEA6VsqdA</recordid><startdate>20230131</startdate><enddate>20230131</enddate><creator>YAO YAO</creator><creator>DAI LIQUN</creator><creator>XIE LILI</creator><creator>CHAI RUIQING</creator><creator>XU SHENGYA</creator><creator>FAN BEN</creator><creator>XIE SHENGWEN</creator><creator>WANG YUE</creator><creator>HE SHAODONG</creator><creator>SUN QIYANG</creator><creator>WANG GENGYUN</creator><scope>EVB</scope></search><sort><creationdate>20230131</creationdate><title>Super-large scale infrared detector test Dewar</title><author>YAO YAO ; DAI LIQUN ; XIE LILI ; CHAI RUIQING ; XU SHENGYA ; FAN BEN ; XIE SHENGWEN ; WANG YUE ; HE SHAODONG ; SUN QIYANG ; WANG GENGYUN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN115655489A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>COLORIMETRY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YAO YAO</creatorcontrib><creatorcontrib>DAI LIQUN</creatorcontrib><creatorcontrib>XIE LILI</creatorcontrib><creatorcontrib>CHAI RUIQING</creatorcontrib><creatorcontrib>XU SHENGYA</creatorcontrib><creatorcontrib>FAN BEN</creatorcontrib><creatorcontrib>XIE SHENGWEN</creatorcontrib><creatorcontrib>WANG YUE</creatorcontrib><creatorcontrib>HE SHAODONG</creatorcontrib><creatorcontrib>SUN QIYANG</creatorcontrib><creatorcontrib>WANG GENGYUN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YAO YAO</au><au>DAI LIQUN</au><au>XIE LILI</au><au>CHAI RUIQING</au><au>XU SHENGYA</au><au>FAN BEN</au><au>XIE SHENGWEN</au><au>WANG YUE</au><au>HE SHAODONG</au><au>SUN QIYANG</au><au>WANG GENGYUN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Super-large scale infrared detector test Dewar</title><date>2023-01-31</date><risdate>2023</risdate><abstract>The invention discloses a super-large-scale infrared detector test Dewar which comprises a vacuum system, a refrigeration system, a temperature measurement and control system and a black body system. The vacuum system is used for providing a vacuum environment required by testing; the refrigerating system is used for providing a mounting platform, a low-temperature cold source and a low-temperature cold background environment for the detector; the temperature measurement and control system is used for monitoring the temperature of each component and controlling the temperature of the refrigerating system; and the blackbody system is used for providing a signal source for the photoelectric performance test of the detector. According to the invention, the problem of testing the photoelectric performance of the super-large-scale spliced infrared detector is solved.
本发明公开了一种超大规模红外探测器测试杜瓦，包括：真空系统、制冷系统、测控温系统和黑体系统；真空系统，用于提供测试所需的真空环境；制冷系统，用于为探测器提供安装平台、低温冷源和低温冷背景环境；测控温系统，用于监测各部件温度、控制制冷系统温度；黑体系统，用于为探测器的光电性能测试提供信号源。本发明解</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
| title | Super-large scale infrared detector test Dewar |
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