Super-large scale infrared detector test Dewar
The invention discloses a super-large-scale infrared detector test Dewar which comprises a vacuum system, a refrigeration system, a temperature measurement and control system and a black body system. The vacuum system is used for providing a vacuum environment required by testing; the refrigerating...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a super-large-scale infrared detector test Dewar which comprises a vacuum system, a refrigeration system, a temperature measurement and control system and a black body system. The vacuum system is used for providing a vacuum environment required by testing; the refrigerating system is used for providing a mounting platform, a low-temperature cold source and a low-temperature cold background environment for the detector; the temperature measurement and control system is used for monitoring the temperature of each component and controlling the temperature of the refrigerating system; and the blackbody system is used for providing a signal source for the photoelectric performance test of the detector. According to the invention, the problem of testing the photoelectric performance of the super-large-scale spliced infrared detector is solved.
本发明公开了一种超大规模红外探测器测试杜瓦,包括:真空系统、制冷系统、测控温系统和黑体系统;真空系统,用于提供测试所需的真空环境;制冷系统,用于为探测器提供安装平台、低温冷源和低温冷背景环境;测控温系统,用于监测各部件温度、控制制冷系统温度;黑体系统,用于为探测器的光电性能测试提供信号源。本发明解 |
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