Fin wave height and wave pitch measuring device and measuring method
The invention belongs to the field of mechanical intelligent detection, and particularly relates to a fin wave height and wave pitch measuring device and method. Comprising the following steps: forming point cloud data of a fin waveform according to fin waveform information collected by a laser scan...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention belongs to the field of mechanical intelligent detection, and particularly relates to a fin wave height and wave pitch measuring device and method. Comprising the following steps: forming point cloud data of a fin waveform according to fin waveform information collected by a laser scanner, firstly performing noise reduction processing on the point cloud data to form a smooth curve dot matrix which retains the geometric shape of the fin waveform, and then identifying wave crests and wave troughs of the smooth curve dot matrix by utilizing a difference algorithm according to the fitted curve dot matrix, namely representing the wave crests and the wave troughs of the fin. The wave height and wave pitch value can be calculated according to the coordinate information of the data points; according to the method, the efficiency and the accuracy of measuring the wave height and the wave pitch of the fin are improved, whether the machined fin meets the accuracy requirement or not can be rapidly and accur |
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