Failure analysis method and device for FPGA (Field Programmable Gate Array) storage unit, electronic equipment and storage medium

The invention belongs to the field of testing of semiconductor devices, and discloses an FPGA storage unit failure analysis method and device, electronic equipment and a storage medium, and the FPGA storage unit failure analysis method provided by the invention comprises the following steps: exciting all storage units, and enabling the level of a failed storage unit in the storage units to be overturned; and detecting a failure storage unit according to a single event upset detection function of the single event upset detection module. According to the FPGA storage unit failure analysis method provided by the invention, the single event upset detection module is applied to failure analysis of the FPGA storage unit, and rapid failure analysis of the FPGA storage unit is realized by utilizing a single event upset detection principle, so that some weak failures and early failures which are difficult to find can be effectively tested; the method not only can be applied to factory test of the FPGA, but also can be