Method for improving current detection precision
The invention discloses a method for improving current detection precision, and the method comprises the steps: 1, dividing a current sample into a plurality of segments according to a function demand and a current detection range; 2, current calibration is carried out on each section, calibrated cu...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a method for improving current detection precision, and the method comprises the steps: 1, dividing a current sample into a plurality of segments according to a function demand and a current detection range; 2, current calibration is carried out on each section, calibrated current points comprise endpoint currents, the calibrated currents between two endpoints are equally divided, and a plurality of points can be calibrated; 3, obtaining a function relation f (k) between the actual output current I and the MCU sampling current IS through calibration data; the calibration data is actual output current I; and 4, calculating an output current I by adopting a successive approximation algorithm. Calibration is carried out through a production tool, the current detection precision is improved through an algorithm, and hardware cost is not increased. After calibration, if the current detection precision of a certain current interval does not reach an ideal state, calibration points can be add |
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