Inductor-capacitor double-end nondestructive testing device under single-end signal excitation
The invention belongs to the field of electromagnetic nondestructive testing, and particularly relates to an inductance and capacitance double-end nondestructive testing device under single-end signal excitation. According to the inductance-capacitance double-end nondestructive testing device, excit...
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| creator | YUAN XINAN DENG CHENGJIE WANG TAO SHI KUNSAN YIN XIAOKANG WEN KAIJIE LI WEI ZHANG ZHAORUI ZHU TING LI XIAO RONG GUANGQIANG CHEN GUOMING |
| description | The invention belongs to the field of electromagnetic nondestructive testing, and particularly relates to an inductance and capacitance double-end nondestructive testing device under single-end signal excitation. According to the inductance-capacitance double-end nondestructive testing device, excitation of two detection modes including a capacitance mode and an inductance mode can be achieved only through one excitation source; and detection signals in the two detection modes can be acquired and processed at the same time, so that defect detection of the insulator-conductor composite structure is realized. The invention discloses an inductance and capacitance double-end nondestructive testing device under single-end signal excitation. The inductance and capacitance double-end nondestructive testing device comprises an excitation sensor unit and a detection circuit, the detection circuit comprises a reference signal generation module, a bimodal signal amplification module, an orthogonal phase locking module a |
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| title | Inductor-capacitor double-end nondestructive testing device under single-end signal excitation |
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