Inductor-capacitor double-end nondestructive testing device under single-end signal excitation

The invention belongs to the field of electromagnetic nondestructive testing, and particularly relates to an inductance and capacitance double-end nondestructive testing device under single-end signal excitation. According to the inductance-capacitance double-end nondestructive testing device, excit...

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Hauptverfasser: YUAN XINAN, DENG CHENGJIE, WANG TAO, SHI KUNSAN, YIN XIAOKANG, WEN KAIJIE, LI WEI, ZHANG ZHAORUI, ZHU TING, LI XIAO, RONG GUANGQIANG, CHEN GUOMING
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention belongs to the field of electromagnetic nondestructive testing, and particularly relates to an inductance and capacitance double-end nondestructive testing device under single-end signal excitation. According to the inductance-capacitance double-end nondestructive testing device, excitation of two detection modes including a capacitance mode and an inductance mode can be achieved only through one excitation source; and detection signals in the two detection modes can be acquired and processed at the same time, so that defect detection of the insulator-conductor composite structure is realized. The invention discloses an inductance and capacitance double-end nondestructive testing device under single-end signal excitation. The inductance and capacitance double-end nondestructive testing device comprises an excitation sensor unit and a detection circuit, the detection circuit comprises a reference signal generation module, a bimodal signal amplification module, an orthogonal phase locking module a